AIMS AND OBJECTIVES OF THE COURSE: To provide the students knowledge in
measuring systems, the application of microprocessors and the improvement of the
measurement systems metrological characteristics as well as knowledge in basic mechanical,
electronic and optical instruments and their application in engineering metrology.
DESCRIPTION OF THE COURSE: The main topics concern: Measuring systems –
designation and structure. Static characteristics and generalized model of the system’s
elements. Dynamic characteristics and dynamic errors. Electrical loading, equivalent
structures. Signals and noise. Methods for the decreasing the errors due the noise and ambient
factors. Smart sensors, types and field of application. Application of the microprocessors,
multichannel input and output of analogue and digital information interfaces and program
control. Programmable timers. Measurement of geometric quantities. Error sources.
Measuring systems and instruments: mechanical, pneumatic, electronic. Measurement of
angles, form and position deviations. Measurement of surface topography. Coordinate
measuring systems, coordinate metrology. Optical systems theory. Types of optical systems,
main properties and characteristics. Optical systems for the measurement of linear and angular
dimensions: microscope, micro-alignment telescope, autocollimators, profile projectors,
comparators, goniometers, spherometers. Laser measuring systems: interferometers,
alignment systems, diffraction measuring systems. Fibre optic sensors.
