AIMS AND OBJECTIVES OF THE COURSE: To provide knowledge in measuring systems, the application of microprocessors and the improvement of the measurement systems metrological characteristics as well as knowledge in basic mechanical, electronic and optical instruments and their application in engineering metrology.
DESCRIPTION OF THE COURSE: The main topics concern: Measuring systems – designation and structure. Static characteristics and generalized model of the system’s elements. Dynamic characteristics and dynamic errors. Electrical loading, equivalent structures. Signals and noise. Methods for the decreasing the errors due the noise and ambient factors. Smart sensors, types and field of application. Application of the microprocessors, multichannel input and output of analogue and digital information interfaces and program control. Programmable timers. Measurement of geometric quantities. Error sources. Measuring systems and instruments: mechanical, pneumatic, electronic. Measurement of angles, form and position deviations. Measurement of surface topography. Coordinate measuring systems, coordinate metrology. Optical systems. Laser measuring systems: interferometers, alignment systems, diffraction measuring systems. Fibre optic sensors.
